The Video Inspection Probe Lite (VIP Lite) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions. With today’s high data rate, high definition services, connector quality and inspection have never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.
Pasternack offers a new line of semi-rigid coaxial test probes designed specifically for assisting in testing microwave circuits. These probes can be used to make sampling measurements without creating a separate subassembly circuit board or adding a connector to the circuit layout. Available in three different diameters of semi-rigid coax, and 3, 6, 9, or 12 inch lengths, these cable assemblies can fit a variety of trace widths and applications.
A.H. Systems offers Current Probe devices designed to be used in generating and measuring high levels of RF current, and in many industrial and scientific applications. They can be used to measure conducted currents without making direct contact with the source conductor or metallic surface.
These E-field laser probes contain an internal microprocessor that enables them to "think" for themselves and adapt to their environment. This provides optimal linearization, temperature compensation, control, and communication functions. AR's six E&H field probes cover the range from 100 kHz - 60 GHz, 0.4 to 1,000 V/m, 0.012 to 17 A/m.